Match! 3.8 粉末衍射軟體-資安軟體/研究分析軟體/心理學軟體/新永資訊有限公司

Windows

• • Personal Computer with Microsoft Windows XP, Vista, Windows 7, Windows 8 or Windows 10 operating system (32- or 64-bit)
• • 2 GB of RAM
• • Hard disk with minimum 500 MB of free disk space
• • Graphics resolution of at least 1024 x 768 pixels (1280 x 800 pixels or more recommended)
• • FullProf release January 2018 (or later) required for Rietveld refinement

macOS

• • Mac with Intel processor and macOS 10.10 "Yosemite" operating system (or later)
• • 2 GB of RAM
• • Hard disk with minimum 500 MB of free disk space
• • Graphics resolution of at least 1024 x 768 pixels (1280 x 800 pixels or more recommended)
• • FullProf release March 2018 (or later) required for Rietveld refinement

Linux

• • Personal Computer with Linux (Intel 64-bit), e.g. Ubuntu
• • 2 GB of RAM
• • Hard disk with minimum 500 MB of free disk space
• • Graphics resolution of at least 1024 x 768 pixels (1280 x 800 pixels or more recommended)
• • FullProf release February 2018 (or later) required for Rietveld refinement

• • Fast single and multiple phase identification from powder diffraction data
• • Use free-of-charge reference patterns calculated from the IUCr/ COD/AMCSD (incl. I/Ic), any ICSD/Retrieve version (released 1993-2002; valid licence required), any ICDD PDF database and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
• • Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
• Create reference databases for neutron diffraction e.g. from cif-files
• • Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
• • Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/I_c and density
• • Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF exports (e.g. for Rietveld analysis)
• • View crystal structures in Diamond with just a few clicks
• • Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
• • Automatic residual searching with respect to identified phases
• • Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
• • Automatic optimization of peak searching sensitivity
• • Fitting of all (or selected) peak parameters to exp. profile data
• • Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
• • Semi-quantitative analysis (Reference Intensity Ratio method)
• • Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
• Integrated database retrieval system and viewer for PDF and user datasheets
• • Multiple step undo/redo
• • Support for new PDF entry numbers (9 digits)
• • User-configurable automatic operation
• • Full parameter control with instant rearrangement of the results list
• • Automatic d-value shifting during search-match process (optionally)
• • Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
• • Comfortable graphical and tabular comparison of peak data and candidate patterns
• • Mouse-controlled pattern graphics zooming and tracking
• • User-configurable HTML-reports
• Online update (automatic or manual)
• • Supported diffraction data file formats (automatic detection):
  •   º  ASCII profile (start, step, intensities or 2 columns)
  •   º  Bruker/Siemens raw data (old and new) (*.raw)
  •   º  Bruker/Siemens DIFFRAC AT peak data (*.dif)
  •   º  DBWS (*.rfl, *.dat)
  •   º  ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
  •   º  Inel raw data (*.dat)
  •   º  Ital Structures raw data (*.esg)
  •   º  Jade/MDI/SCINTAG raw data (*.mdi)
  •   º  JEOL ASCII Export raw data (*.txt)
  •   º  PANalytical XRDML Scan raw data (*.xrdml)
  •   º  PANalytical/Philips peak data (*.udi)
  •   º  PANalytical/Philips raw data (*.rd, *.udf)
  •   º  Rigaku raw data (*.raw)
  •   º  SCINTAG raw data (*.raw, *.rd)
  •   º  Shimadzu raw data (*.raw)
  •   º  Siemens (*.uxd)
  •   º  Sietronics XRD scan data (*.cpi)
  •   º  Stoe raw data (*.raw)
  •   º  Stoe peak data (*.pks)